Precision landmark location for machine vision and photogrammetry : finding and achieving the maximum possible accuracy /

Main Author: Gutierrez, Josae A.
Other Authors: Armstrong, Brian Stewart Randall.
Format: Book
Language:English
Published: London : Springer, c2008.
Subjects:
Online Access:http://www.loc.gov/catdir/toc/fy0803/2007936782.html
http://dx.doi.org/10.1007/978-1-84628-913-2
Item Description:Also available as E-Book.
Physical Description:xi, 162 p. : ill. (some col.) ; 24 cm.
Bibliography:Includes bibliographical references (p. [155]-157) and index.
ISBN:9781846289125