Precision landmark location for machine vision and photogrammetry : finding and achieving the maximum possible accuracy /
Main Author: | |
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Other Authors: | |
Format: | Book |
Language: | English |
Published: |
London :
Springer,
c2008.
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Subjects: | |
Online Access: | http://www.loc.gov/catdir/toc/fy0803/2007936782.html http://dx.doi.org/10.1007/978-1-84628-913-2 |
Item Description: | Also available as E-Book. |
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Physical Description: | xi, 162 p. : ill. (some col.) ; 24 cm. |
Bibliography: | Includes bibliographical references (p. [155]-157) and index. |
ISBN: | 9781846289125 |