Precision landmark location for machine vision and photogrammetry : finding and achieving the maximum possible accuracy /

Main Author: Gutierrez, Josae A.
Other Authors: Armstrong, Brian Stewart Randall.
Format: Book
Language:English
Published: London : Springer, c2008.
Subjects:
Online Access:http://www.loc.gov/catdir/toc/fy0803/2007936782.html
http://dx.doi.org/10.1007/978-1-84628-913-2
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040 |a UKM 
050 0 0 |a TA1634  |b .G88 2008 
100 1 |a Gutierrez, Josae A. 
245 1 0 |a Precision landmark location for machine vision and photogrammetry :  |b finding and achieving the maximum possible accuracy /  |c Josâe A. Gutierrez, Brian S.R. Armstrong. 
260 |a London :  |b Springer,  |c c2008. 
300 |a xi, 162 p. :  |b ill. (some col.) ;  |c 24 cm. 
500 |a Also available as E-Book. 
504 |a Includes bibliographical references (p. [155]-157) and index. 
650 0 |a Computer vision. 
650 0 |a Photogrammetry  |x Digital techniques. 
700 1 |a Armstrong, Brian Stewart Randall. 
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