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991008s1998 gr erb 001 0 eng d |
| 020 |
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|a 0792381076
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| 040 |
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|a GrAtEKP.Mathimatiko
|b gre
|e AACR2
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| 082 |
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|2 22
|a 621.381
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| 100 |
1 |
|
|a Kuo, Way,
|d 1951-
|
| 245 |
1 |
2 |
|a A reliability, yield, and stress burn-in :
|b a unified approach for microelectronics systems manufacturing and soft ware development /
|c by Way Kuo, Wei-Ting Kary Chien, Taeho Kim
|
| 260 |
|
|
|a Dordrecht :
|b Kluwer Academic,
|c c1998
|
| 300 |
|
|
|a xvii, 394 p. :
|b ill. ;
|c 24 cm.
|
| 504 |
|
|
|a Includes bibliographical references and index
|
| 650 |
|
0 |
|a Integrated circuits
|x Design and construction
|x Reliability
|
| 650 |
|
0 |
|a Microelectronics
|x Reliability
|
| 650 |
|
0 |
|a Computer software
|x Development
|x Reliability
|
| 650 |
|
0 |
|a Semiconductors
|x Computer programms
|
| 700 |
1 |
|
|a Chien, Wei-Ting Kary
|x Reliability
|
| 700 |
1 |
|
|a Kim, Taeho
|
| 952 |
|
|
|a GrAtEKP
|b 59cd0ed46c5ad134460e909c
|c 998a
|d 945l
|e 621.381 KuoW r 1998
|t 1
|x m
|z Books
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