A reliability, yield, and stress burn-in : a unified approach for microelectronics systems manufacturing and soft ware development /
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| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Dordrecht :
Kluwer Academic,
c1998
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| Subjects: |
| Physical Description: | xvii, 394 p. : ill. ; 24 cm. |
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| Bibliography: | Includes bibliographical references and index |
| ISBN: | 0792381076 |