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20171111231151.0 |
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041215s1987 gr r 000 0 eng d |
| 040 |
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|a GR-KoDPT
|b gre
|e AACR2
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| 050 |
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|a TK7871.85
|b .E43 1987
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| 082 |
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|2 19
|a 621.3815/2
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| 245 |
0 |
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|a Electronics reliability and measurement technology/
|c edited by Joseph S. Heyman
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| 260 |
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|a Washington, D.C.:
|b National Aeronautics and Space Administration, Scientific and Technical Information Office,
|c 1987
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| 300 |
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|a ix, 139 σ. :
|b εικ. ;
|c 28 εκ.
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| 490 |
0 |
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|a NASA conference publication
|v 2472
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| 500 |
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|a "Proceedings of a conference sponsored by the NASA Langley Research Center Hampton, Virginia, United States Air Force Space Division, Los Angeles, California, the National Security Industrial Association, Washington, D.C., and the Aerospace Industry Association, Washington, D.C., and held at Langley Research Center Hampton, Virginia, June 3-5, 1986."
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| 504 |
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|a Περιέχει βιβλιογραφίες
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| 650 |
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0 |
|a Semiconductors
|x Reliability
|x Measurement
|x Congresses
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| 650 |
|
0 |
|a Electronic apparatus and appliances
|x Reliability
|x Measurement
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| 700 |
1 |
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|a Heyman, Joseph S.
|x Congresses
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| 710 |
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|a United States
|b National Aeronautics and Space Administration
|b Scientific and Technical Information Office
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| 710 |
2 |
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|a Langley Research Center
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| 952 |
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|a GR-KoDPT
|b 59cc2c826c5ad13446fa64f1
|c 998a
|d 945l
|e TL 521 .3
|t 1
|x m
|z Books
|
