Electronics reliability and measurement technology/

Corporate Authors: United States National Aeronautics and Space Administration Scientific and Technical Information Office, Langley Research Center
Other Authors: Heyman, Joseph S.
Format: Book
Language:English
Published: Washington, D.C.: National Aeronautics and Space Administration, Scientific and Technical Information Office, 1987
Series:NASA conference publication 2472
Subjects:
ΒιβλιοθήκηΤαξιθετικός αριθμόςΑριθμός ΑντιτύπωνΠληροφορίεςΚατάσταση
Δημοκρίτειο Πανεπιστήμιο ΘράκηςTL 521 .31ΠροβολήOPAC