Cover Image

Yield and reliability in microwave circuit and system design/

Main Author:	Meehan, Michael D.
Corporate Author:	Artech House
Other Authors:	Purviance, John
Format:	Book
Language:	English
Published:	Boston: Artech House, c1993
Series:	Artech House microwave library
Subjects:	Microwave integrated circuits > Design and construction > Statistical methods Engineering design > Statistical methods Computer-aided design Engineering design > - Statistical methods

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