Yield and reliability in microwave circuit and system design/

Main Author: Meehan, Michael D.
Corporate Author: Artech House
Other Authors: Purviance, John
Format: Book
Language:English
Published: Boston: Artech House, c1993
Series:Artech House microwave library
Subjects:
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100 1 0 |a Meehan, Michael D. 
245 1 0 |a Yield and reliability in microwave circuit and system design/  |c Michael D. Meehan and John Purviance 
260 1 0 |a Boston:  |b Artech House,  |c c1993 
300 1 0 |a xviii, 276 σ. :  |b εικ. ;  |c 24 εκ. 
490 0 0 |a Artech House microwave library 
504 0 0 |a Περιέχει βιβλιογραφικές παραπομπές και ευρετήριο 
504 0 0 |a Includes bibliographical references and index. 
650 0 0 |a Microwave integrated circuits  |x Design and construction  |x Statistical methods 
650 0 0 |a Engineering design  |x Statistical methods 
650 0 0 |a Computer-aided design 
650 0 0 |a Microwave integrated circuits  |x Design and construction  |x Statistical methods 
650 0 0 |a Engineering design  |x - Statistical methods 
700 1 0 |a Purviance, John 
710 1 0 |a Artech House 
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