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| LEADER |
00757nam a2200205 a 4500 |
| 001 |
2007412 |
| 005 |
20171111235953.0 |
| 008 |
090812t2007 enka b 001 0 eng |
| 020 |
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|a 9780470016084
|q hbk.
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| 040 |
|
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|a DLC
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| 050 |
0 |
0 |
|a QC443
|b .F85 2007
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| 100 |
1 |
0 |
|a Fujiwara, Hiroyuki.
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| 245 |
1 |
0 |
|a Spectroscopic ellipsometry :
|b principles and applications /
|c Hiroyuki Fujiwara.
|
| 260 |
1 |
0 |
|a Chichester, England ;
|b John Wiley & Sons,
|c c2007.
|a Hoboken, NJ :
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| 300 |
1 |
0 |
|a xviii, 369 p. :
|b ill. ;
|c 24 cm.
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| 650 |
1 |
0 |
|a Ellipsometry.
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| 650 |
1 |
0 |
|a Spectrum analysis.
|
| 650 |
1 |
0 |
|a Materials
|x Optical properties.
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| 952 |
|
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|a GR-AtNTU
|b 59cc1b0d6c5ad13446f78db9
|c 998a
|d 945l
|e 620.11295 FUJ
|t 1
|x m
|z Books
|
| 952 |
|
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|a CY-LiCUT
|b 5a01a6326c5ad14ac1e79882
|c 945l
|d 998a
|t 1
|x m
|z Books
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