Description: Spectroscopic ellipsometry :

Main Author:	Fujiwara, Hiroyuki.
Format:	Book
Language:	English
Published:	Chichester, England ; Hoboken, NJ : John Wiley & Sons, c2007.
Subjects:	Ellipsometry. Spectrum analysis. Materials > Optical properties.

Physical Description:	xviii, 369 p. : ill. ; 24 cm.
ISBN:	9780470016084