Applied survival analysis: regression modeling of time-to-event data/

Main Author: Hosmer, David W.
Corporate Author: Wiley-Interscience
Other Authors: Lemeshow, Stanley
Format: Book
Language:English
Published: Hoboken, N.J.: Wiley-Interscience, c2008
Edition:2nd ed.
Series:Wiley series in probability and statistics
Subjects:

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