Applied survival analysis: regression modeling of time-to-event data/

Main Author: Hosmer, David W.
Corporate Author: Wiley-Interscience
Other Authors: Lemeshow, Stanley
Format: Book
Language:English
Published: Hoboken, N.J.: Wiley-Interscience, c2008
Edition:2nd ed.
Series:Wiley series in probability and statistics
Subjects:
Physical Description:xiii, 392 σ. : εικ. ; 25 εκ.
Bibliography:Περιέχει βιβλιογραφικές παραπομπές (σ. 365-381) και ευρετήριο
Includes bibliography and index.
ISBN:0471754994