Pattern classification: a unified view of statistical and neural approaches/

Main Author: Schurmann, Jurgen
Corporate Authors: John Wiley & Sons, Wiley
Format: Book
Language:English
Published: New York: Wiley, c1996
Subjects:
Item Description:"A Wiley-Interscience publication."
Physical Description:xvii, 373 p. : ill. ; 25 cm.
Bibliography:Includes bibliographical references (p. 364-367) and index
Includes bibliographies and index.
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ISBN:0471135348