Fakebusters II : scientific detection of fakery in art and philately /
Corporate Authors: | Society of Photo-optical Instrumentation Engineers., International Center for Art Intelligence. |
---|---|
Other Authors: | Weiss, Richard J., Chartier, Duane R. |
Format: | Book |
Language: | English |
Published: |
Singapore ; Hackensack, N.J. :
World Scientific,
©2004.
|
Series: | Series in popular science ;
v. 4 |
Subjects: | |
Online Access: | http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=167306 |
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