Cover Image

Fakebusters II : scientific detection of fakery in art and philately /

Corporate Authors: Society of Photo-optical Instrumentation Engineers., International Center for Art Intelligence.
Other Authors: Weiss, Richard J., Chartier, Duane R.
Format: Book
Language:English
Published: Singapore ; Hackensack, N.J. : World Scientific, ©2004.
Series:Series in popular science ; v. 4
Subjects:
Art > Forgeries
Art > Radiography
Art > Expertising
Expertising, X-ray
Science and the arts
Art and science
Art > Forgeries.
Art > Radiography.
Art > Expertising.
Expertising, X-ray.
Science and the arts.
Art and science.
TRAVEL > Museums, Tours, Points of Interest.
BUSINESS & ECONOMICS > Museum Administration & Museology.
REFERENCE > General.
Vervalsing.
Detectie.
Online Access:http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=167306
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240 1 0 |a Scientific detection of fakery in art and philately 
245 0 0 |a Fakebusters II :  |b scientific detection of fakery in art and philately /  |c edited by Richard J. Weiss and Duane Chartier. 
246 3 |a Scientific detection of fakery in art and philately 
260 |a Singapore ;  |b World Scientific,  |c ©2004.  |a Hackensack, N.J. : 
300 |a 1 online resource (x, 317 pages) :  |b illustrations (some color). 
490 1 |a Series in popular science ;  |v v. 4 
500 |a "Based on the proceedings of the symposium held at Photonics East 1999 [in Boston on September 20-21, 1999], sponsored by SPIE, the International Optical Engineering Society, Bellingham, WA 98227-0010, USA ; ICAI, the International Center for Art Intelligence, Culver City, CA 90230-5109, USA ; FFE, Fakes, Forgeries, and Experts, Castagnola, CH-6976, Switzerland." 
504 |a Includes bibliographical references. 
505 0 |a Table of Contents; 1. Preface; 2. R.W. WOOD: FAKEBUSTER EXTRAORDINAIRE; 3. Art Fakes and the Statue of Limitations; 4. Determination of Authenticity of Engraved Scrimshaw; 5. SCIENTIFIC DETECTION OF PHILATELIC FORGERIES; 6. Insurability of Art; 7. DNA as a Security Marker; 8. Authentication at a Small Museum: the Kindness of Strangers; 9. ART IN TRANSIT: INTERNATIONAL TRANSPORTATION OF FINE ART; 10. The Use of Raman Spectroscopy in the Art World; 11. Fakes, Forgeries, and Experts (FFE); 12. Madame Curie; 13. Non-Destructive Analysis of Artifacts by Using XRF, FTIR, and SEM/EDX. 
650 0 |a Art  |x Forgeries 
650 0 |a Art  |x Radiography 
650 0 |a Art  |x Expertising 
650 0 |a Expertising, X-ray 
650 0 |a Science and the arts 
650 0 |a Art and science 
650 4 |a Art  |x Forgeries. 
650 4 |a Art  |x Radiography. 
650 4 |a Art  |x Expertising. 
650 4 |a Expertising, X-ray. 
650 4 |a Science and the arts. 
650 4 |a Art and science. 
650 7 |a TRAVEL  |x Museums, Tours, Points of Interest. 
650 7 |a BUSINESS & ECONOMICS  |x Museum Administration & Museology. 
650 7 |a REFERENCE  |x General. 
650 7 |a Art and science. 
650 7 |a Art  |x Expertising. 
650 7 |a Art  |x Forgeries. 
650 7 |a Art  |x Radiography. 
650 7 |a Expertising, X-ray. 
650 7 |a Science and the arts. 
650 1 7 |a Vervalsing. 
650 1 7 |a Detectie. 
700 1 |a Weiss, Richard J. 
700 1 |a Chartier, Duane R. 
710 2 |a Society of Photo-optical Instrumentation Engineers. 
710 2 |a International Center for Art Intelligence. 
856 4 0 |a Philatelic Fakes Forgeries and Experts.  |u http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=167306 
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