Description: Fakebusters II :

Corporate Authors:	Society of Photo-optical Instrumentation Engineers., International Center for Art Intelligence.
Other Authors:	Weiss, Richard J., Chartier, Duane R.
Format:	Book
Language:	English
Published:	Singapore ; Hackensack, N.J. : World Scientific, ©2004.
Series:	Series in popular science ; v. 4
Subjects:	Art > Forgeries Art > Radiography Art > Expertising Expertising, X-ray Science and the arts Art and science Art > Forgeries. Art > Radiography. Art > Expertising. Expertising, X-ray. Science and the arts. Art and science. TRAVEL > Museums, Tours, Points of Interest. BUSINESS & ECONOMICS > Museum Administration & Museology. REFERENCE > General. Vervalsing. Detectie.
Online Access:	http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=167306

Item Description:	"Based on the proceedings of the symposium held at Photonics East 1999 [in Boston on September 20-21, 1999], sponsored by SPIE, the International Optical Engineering Society, Bellingham, WA 98227-0010, USA ; ICAI, the International Center for Art Intelligence, Culver City, CA 90230-5109, USA ; FFE, Fakes, Forgeries, and Experts, Castagnola, CH-6976, Switzerland."
Physical Description:	1 online resource (x, 317 pages) : illustrations (some color).
Bibliography:	Includes bibliographical references.
ISBN:	9812701370 9789812701374 9789812560254 9812560254