Digital holography for MEMS and microsystem metrology

Corporate Author: ebrary, Inc.
Other Authors: Asundi, Anand.
Format: Book
Language:English
Published: Chichester, West Sussex, U.K. ; Hoboken, N.J. : Wiley, 2011.
Series:The Wiley microsystem and nanotechnology series
Subjects:
Online Access:http://site.ebrary.com/lib/ucy/Doc?id=10484809
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300 |a xxii, 205 p. :  |b ill., port. 
490 1 |a The Wiley microsystem and nanotechnology series 
504 |a Includes bibliographical references and index. 
650 0 |a Microelectromechanical systems  |x Measurement. 
650 0 |a Microelectronics  |x Measurement. 
650 0 |a Holographic testing. 
650 0 |a Image processing  |x Digital techniques. 
700 1 |a Asundi, Anand. 
710 2 |a ebrary, Inc. 
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