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01038nam a2200217 a 4500 |
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1791630 |
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20171111234538.0 |
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130212s2012 gw a sb 001 0 eng d |
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|z 9783527330324
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040 |
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|a CaPaEBR
|z 9783527646371 (e-book)
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050 |
1 |
4 |
|a QC585
|b .H54 2012eb
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245 |
0 |
0 |
|a High-k gate dielectrics for CMOS technology
|c edited by Gang He and Zhaoqi Sun.
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260 |
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|a Weinheim :
|b Wiley-VCH,
|c 2012.
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300 |
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|a xxxi, 558 p. :
|b ill. (some col.)
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504 |
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|a Includes bibliographical references and index.
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505 |
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|a pt. 1. Scaling and challenging of Si-based CMOS -- pt. 2. High-k deposition and materials characterization -- pt. 3. Challenge in interface engineering and electrode -- pt. 4. Development in non-Si-based CMOS technology -- pt. 5. High-k Application in novel devices -- pt. 6. Challenge and directions.
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650 |
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0 |
|a Dielectrics.
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700 |
1 |
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|a He, Gang.
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710 |
2 |
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|a ebrary, Inc.
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856 |
4 |
0 |
|u http://site.ebrary.com/lib/ucy/Doc?id=10653595
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952 |
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|a CY-NiOUC
|b 5a0458436c5ad14ac1ed0f44
|c 998a
|d 945l
|e -
|t 1
|x m
|z Books
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