High-k gate dielectrics for CMOS technology

Corporate Author: ebrary, Inc.
Other Authors: He, Gang.
Format: Book
Language:English
Published: Weinheim : Wiley-VCH, 2012.
Subjects:
Online Access:http://site.ebrary.com/lib/ucy/Doc?id=10653595
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020 |z 9783527330324 
040 |a CaPaEBR  |z 9783527646371 (e-book) 
050 1 4 |a QC585  |b .H54 2012eb 
245 0 0 |a High-k gate dielectrics for CMOS technology  |c edited by Gang He and Zhaoqi Sun. 
260 |a Weinheim :  |b Wiley-VCH,  |c 2012. 
300 |a xxxi, 558 p. :  |b ill. (some col.) 
504 |a Includes bibliographical references and index. 
505 0 |a pt. 1. Scaling and challenging of Si-based CMOS -- pt. 2. High-k deposition and materials characterization -- pt. 3. Challenge in interface engineering and electrode -- pt. 4. Development in non-Si-based CMOS technology -- pt. 5. High-k Application in novel devices -- pt. 6. Challenge and directions. 
650 0 |a Dielectrics. 
700 1 |a He, Gang. 
710 2 |a ebrary, Inc. 
856 4 0 |u http://site.ebrary.com/lib/ucy/Doc?id=10653595 
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