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Atomic force microscopy/scanning tunneling microscopy 3

Corporate Authors:	ebrary, Inc., Symposium on Atomic Force/Scanning Tunneling Microscopy
Other Authors:	Cohen, Samuel H.
Format:	Book
Language:	English
Published:	New York : Kluwer Academic/Plenum Publishers, c1999.
Subjects:	Atomic force microscopy
Online Access:	http://site.ebrary.com/lib/ucy/Doc?id=10047028

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