Cover Image

ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /

Corporate Authors: International Symposium for Testing and Failure Analysis San Jose, Calif.), ASM International., Electronic Device Failure Analysis Society.
Format: Book
Language:English
Published: Materials Park, OH : ASM International, c2005.
Subjects:
Electronics > Materials > Testing
Electronic apparatus and appliances > Testing
Online Access:http://site.ebrary.com/lib/ucy/Doc?id=10323479
Physical Description:xviii, 524 p. : ill.
Bibliography:Includes bibliographical references and index.

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