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ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /

Corporate Authors:	International Symposium for Testing and Failure Analysis San Jose, Calif.), ASM International., Electronic Device Failure Analysis Society.
Format:	Book
Language:	English
Published:	Materials Park, OH : ASM International, c2005.
Subjects:	Electronics > Materials > Testing Electronic apparatus and appliances > Testing
Online Access:	http://site.ebrary.com/lib/ucy/Doc?id=10323479

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