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051221s2005 ohua sb 101 0 eng d |
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|z 087170823X
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|a CaPaEBR
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1 |
4 |
|a TK7871
|b .I63 2005eb
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| 111 |
2 |
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|a International Symposium for Testing and Failure Analysis
|c San Jose, Calif.)
|d d2005 :
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| 245 |
1 |
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|a ISTFA 2005
|b Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /
|c sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International.
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| 260 |
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|a Materials Park, OH :
|b ASM International,
|c c2005.
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| 300 |
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|a xviii, 524 p. :
|b ill.
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| 504 |
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|a Includes bibliographical references and index.
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| 650 |
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0 |
|a Electronics
|x Materials
|x Testing
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| 650 |
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0 |
|a Electronic apparatus and appliances
|x Testing
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| 710 |
2 |
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|a ASM International.
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| 710 |
2 |
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|a Electronic Device Failure Analysis Society.
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| 856 |
4 |
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|a ebrary, Inc.
|u http://site.ebrary.com/lib/ucy/Doc?id=10323479
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| 952 |
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|a CY-NiOUC
|b 5a0456156c5ad14ac1eccdf6
|c 998a
|d 945l
|e -
|t 1
|x m
|z Books
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