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| LEADER |
00783nam a2200217 a 4500 |
| 001 |
1721124 |
| 005 |
20171111234434.0 |
| 008 |
040209s1995 cy da r 000 u eng d |
| 020 |
|
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|a 0890067260
|q hbk.
|
| 040 |
|
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|a CY
|b University of Cyprus
|e AACR2
|
| 050 |
|
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|a TK7871.99.M44R35 1995
|
| 100 |
1 |
|
|a Rajsuman, Rochit
|
| 245 |
1 |
0 |
|a Iddq testing for CMOS VLSI/
|c Rochit Rajsuman
|
| 260 |
|
|
|a Boston:
|b Artech House,
|c c1995
|
| 300 |
|
|
|a xii, 193 p. :
|b ill. ;
|c 24 cm.
|
| 490 |
0 |
|
|a The Artech House optoelectronics library
|
| 504 |
|
|
|a Includes bibliographical references(p.181-185) and index.
|
| 650 |
|
0 |
|a Iddq testing
|
| 650 |
|
0 |
|a Integrated circuits
|x Very large scale integration
|
| 650 |
|
0 |
|x Testing
|
| 952 |
|
|
|a CY-NiOUC
|b 5a044d9d6c5ad14ac1ebdc84
|c 998a
|d 945l
|e TK7871.99.M44R35 1995
|t 1
|x m
|z Books
|
