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High quality test pattern generation techniques for digital VLSI circuits/

Main Author: Νεοφύτου, Στέλιος Ν.
Format: Book
Language:English
Published: Nicosia: [s.n.], 2009
Subjects:
Integrated circuits > Very large scale integration
Testing
Table of Contents:
  • Includes bibliographical references (p. 153-163).

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