High quality test pattern generation techniques for digital VLSI circuits/

Main Author: Νεοφύτου, Στέλιος Ν.
Format: Book
Language:English
Published: Nicosia: [s.n.], 2009
Subjects:
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008 101008s2009 cy da r 000 u eng d
040 |a CY  |b University of Cyprus  |e AACR-2 
050 |a TK7874.75.N46 2009 
100 1 |a Νεοφύτου, Στέλιος Ν. 
245 1 0 |a High quality test pattern generation techniques for digital VLSI circuits/  |c by Stelios N. Neophytou 
260 |a Nicosia:  |b [s.n.],  |c 2009 
300 |a xvi, 166 p. :  |b ill. ;  |c 30 cm. 
500 |a Supervisor Professor: Maria K. Michael. 
505 0 |a Includes bibliographical references (p. 153-163). 
650 0 |a Integrated circuits  |x Very large scale integration 
650 0 |x Testing 
952 |a CY-NiOUC  |b 5a0439ab6c5ad14ac1e9b9d6  |c 998a  |d 945l  |e TK7874.75.N46 2009  |t 1  |x m  |z Books