Description: High quality test pattern generation techniques for digital VLSI circuits/

Main Author:	Νεοφύτου, Στέλιος Ν.
Format:	Book
Language:	English
Published:	Nicosia: [s.n.], 2009
Subjects:	Integrated circuits > Very large scale integration Testing

Item Description:	Supervisor Professor: Maria K. Michael.
Physical Description:	xvi, 166 p. : ill. ; 30 cm.