Description: Delay fault testing for VLSI circuits/

Main Author:	Krstic, Angela, 1965-
Other Authors:	Cheng, Kwang-Ting,
Format:	Book
Language:	English
Published:	Boston ; Dordrecht: Kluwer Academic Publishers, c1998
Series:	Frontiers in electronic testing
Subjects:	Delay faults (Semiconductors) Integrated circuits > Very large scale integration

Physical Description:	xii, 191 p. : ill. ; 24 cm.
Bibliography:	Includes bibliographical references (p. 173-188) and index.
ISBN:	0792382951