Transmission electron microscopy and diffractometry of materials/

Main Author: Fultz, B.Brent
Other Authors: Howe, James M.,
Format: Book
Language:English
Published: Berlin New York: Springer, c2002
Edition:2nd ed.
Subjects:
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020 |a 3540437649  |q hbk. 
040 |a CY  |b University of Cyprus  |e AACR2 
050 |a TA417.23.F85 2002 
100 1 |a Fultz, B.Brent 
245 1 0 |a Transmission electron microscopy and diffractometry of materials/  |c Brent Fultz, James Howe 
250 |a 2nd ed. 
260 |a Berlin  |b Springer,  |c c2002  |a New York: 
300 |a xxi, 748 p. :  |b ill. ;  |c 24 cm. 
504 |a Includes bibliographical references and index. 
650 0 |a Materials  |x Microscopy 
650 0 |a Transmission electron microscopy 
700 1 |a Howe, James M., 
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