Transmission electron microscopy and diffractometry of materials/
| Main Author: | |
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Berlin New York:
Springer,
c2002
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| Edition: | 2nd ed. |
| Subjects: |
| Physical Description: | xxi, 748 p. : ill. ; 24 cm. |
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| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 3540437649 |