Applied logistic regression /
Main Author: | Hosmer, David W. |
---|---|
Other Authors: | Lemeshow, Stanley. |
Format: | Book |
Language: | English |
Published: |
New York :
Wiley,
c2000.
|
Edition: | 2nd ed. |
Series: | Wiley series in probability and statistics
|
Subjects: | |
Online Access: | http://www.loc.gov/catdir/bios/wiley042/00036843.html http://www.loc.gov/catdir/toc/onix05/00036843.html |
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