Applied logistic regression /

Main Author: Hosmer, David W.
Other Authors: Lemeshow, Stanley.
Format: Book
Language:English
Published: New York : Wiley, c2000.
Edition:2nd ed.
Series:Wiley series in probability and statistics
Subjects:
Online Access:http://www.loc.gov/catdir/bios/wiley042/00036843.html
http://www.loc.gov/catdir/toc/onix05/00036843.html
Physical Description:xii, 373 p. : ill. ; 25 cm.
Bibliography:Includes bibliographical references (p. 352-365) and index.
ISBN:9780471356325