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20171111233305.0 |
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000905s1998 gr erb 001 0 eng d |
| 020 |
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|a 0306458969
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| 040 |
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|a GrAtEKP.ximviolfarmak
|b gre
|e AACR2
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| 050 |
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|a TA418.7
|b .B43 1998
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| 082 |
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0 |
|2 22
|a 620.44
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| 245 |
0 |
0 |
|a Beam effects, surface topography, and depth profiling in surface analysis ; Alvin W. Czanderna, Theodore E. Madey , Cedric J. Powell
|
| 260 |
|
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|a New York:
|b Plenum Press,
|c c1998
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| 300 |
|
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|a xix, 430 p. :
|b ill., diagr., tabl. ;
|c 24 cm.
|
| 490 |
0 |
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|a Methods of surface characterization ;
|v 5
|
| 504 |
|
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|a Includes bibliographical references and index
|
| 650 |
|
0 |
|a Surfaces (Technology)
|x Analysis
|
| 650 |
|
0 |
|a Materials
|x Effect of radiation on
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| 700 |
1 |
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|a Czanderna, Alvin Warren,
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| 700 |
1 |
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|a Madey, Theodore E
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| 700 |
1 |
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|a Powell, C. J
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| 952 |
|
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|a GrAtEKP
|b 59cd14ca6c5ad134460f2d78
|c 998a
|d 945l
|e 620.44 CzaA b 1998
|t 1
|x m
|z Books
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