Beam effects, surface topography, and depth profiling in surface analysis ; Alvin W. Czanderna, Theodore E. Madey , Cedric J. Powell
| Other Authors: | , , |
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| Format: | Book |
| Language: | English |
| Published: |
New York:
Plenum Press,
c1998
|
| Series: | Methods of surface characterization ;
5 |
| Subjects: |
| Physical Description: | xix, 430 p. : ill., diagr., tabl. ; 24 cm. |
|---|---|
| Bibliography: | Includes bibliographical references and index |
| ISBN: | 0306458969 |