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Atomic force microscopy/scanning tunneling microscopy/

Corporate Author:	U.S. Army Natick Research, Development and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium
Other Authors:	Cohen, Samuel H, Bray, Mona T, Lightbody, Marcia L
Format:	Book
Language:	English
Published:	New York: Plenum Press, c 1994
Subjects:	Atomic force microscopy Scanning tunneling microscopy

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