Holdings: Applied logistic regression /

Cover Image

Applied logistic regression /

Main Author:	Hosmer, David W.
Other Authors:	Lemeshow, Stanley
Format:	Book
Language:	English
Published:	New York : Wiley, c2000.
Edition:	2nd ed.
Subjects:	Regression analysis

Βιβλιοθήκη	Ταξιθετικός αριθμός	Αριθμός Αντιτύπων	Πληροφορίες	Κατάσταση
ΤΕΙ Κρήτης	QA278.2 .H67 2000	3	Προβολή	OPAC

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