Formulation of the information capacity of the optical-mechanical line-scan imaging process/

Main Author: Huck, Friedrich O.
Corporate Authors: United States National Aeronautics and Space Administration, United States. National Aeronautics and Space Administration, Langley Research Center
Other Authors: Park, Stephen Keith
Format: Book
Language:English
Published: Washington, D.C.: National Aeronautics and Space Administration, 1975
Series:NASA technical note 7942
Subjects:

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