Intrinsic point defects, impurities, and their diffusion in silicon /
Main Author: | |
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Format: | Book |
Published: |
Wien:
Springer,
c2004
|
Series: | Computational microelectronics
|
Subjects: |
Physical Description: | xxi, 554 p. : fig. ; 24 cm. |
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Bibliography: | Includes bibliographical references, index. |
ISBN: | 3211206876 |