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Defect analysis in electron mi...
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Defect analysis in electron microscopy/
Corporate Author:
Champan & Hall
Other Authors:
LORETTO, M. H.
Format:
Book
Language:
English
Published:
London:
Chapman and Hall,
1975
Subjects:
Biology
ELECTRON
MICROSCOPE
Βιολογία
Ηλεκτρόνια
Μικροσκόπιο
Holdings
Description
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Physical Description:
iv, 134p. : ill., tabl.
Bibliography:
Bibliography
ISBN:
0412137607
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