Description: Applied logistic regression /

Main Author:	Hosmer, David W.
Other Authors:	Lemeshow, Stanley, Cook, Elizabeth Donohoe
Format:	Book
Language:	English
Published:	New York : Wiley, c2000.
Edition:	2nd ed.
Subjects:	Regression analysis

Item Description:	"A Wiley-Interscience publication."
Physical Description:	xii, 373 p. : ill. ; 28 cm.
Bibliography:	Includes bibliographical references and index.
ISBN:	0471356328