On-line testing for VLSI/

Corporate Author: Kluwer
Other Authors: Nicolaidis, Michael, Zorian, Yervant
Format: Book
Language:English
Published: Boston: Kluwer Academic Publishers, c1998
Subjects:
Item Description:"Reprinted from a special issue of Journal of electronic testing, theory and applications, volume 12, nos. 1 & 2, February/March 1998."
Physical Description:159 σ. : εικ. ; 27 εκ.
Bibliography:Περιέχει βιβλιογραφικές παραπομπές και ευρετήριο
ISBN:0792381327