Scanning electron microscope optics and spectrometers
Main Author: | |
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Corporate Author: | |
Format: | Book |
Language: | English |
Published: |
Singapore ; Hackensack, N.J. :
World Scientific Pub. Co.,
2011.
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Subjects: | |
Online Access: | http://site.ebrary.com/lib/ucy/Doc?id=10480049 |
Physical Description: | xiii, 402 p. : ill. (some col.) |
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Bibliography: | Includes bibliographical references and index. |