Description: Applied logistic regression

Main Author:	Hosmer, David W.
Corporate Author:	ebrary, Inc.
Other Authors:	Lemeshow, Stanley.
Format:	Book
Language:	English
Published:	Hoboken, N.J. : Wiley, 2013.
Edition:	3rd ed. /
Series:	Wiley series in probability and statistics
Subjects:	Regression analysis.
Online Access:	http://site.ebrary.com/lib/ucy/Doc?id=10677827

Physical Description:	xvi, 500 p. : ill.
Bibliography:	Includes bibliographical references and index.