Cover Image

Terrestrial neutron-induced soft errors in advanced memory devices

Corporate Author:	ebrary, Inc.
Other Authors:	Nakamura, Takashi,
Format:	Book
Language:	English
Published:	Hackensack, NJ : World Scientific, c2008.
Subjects:	Semiconductor storage devices. Neutron irradiation. Radiation dosimetry.
Online Access:	http://site.ebrary.com/lib/ucy/Doc?id=10255560

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