Radiation effects and soft errors in integrated circuits and electronic devices

Corporate Author: ebrary, Inc.
Other Authors: Schrimpf, Ronald Donald.
Format: Book
Language:English
Published: Singapore ; New Jersey : World Scientific Pub., c2004.
Series:Selected topics in electronics and systems ; vol. 34
Subjects:
Online Access:http://site.ebrary.com/lib/ucy/Doc?id=10255983
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245 0 0 |a Radiation effects and soft errors in integrated circuits and electronic devices  |c editors, R.D. Schrimpf, D.M. Fleetwood. 
260 |a Singapore ;  |b World Scientific Pub.,  |c c2004.  |a New Jersey : 
300 |a viii, 339 p. :  |b ill. 
490 1 |a Selected topics in electronics and systems ;  |v vol. 34 
500 |a Also published in the International Journal of High Speed Electronics and Systems, v. 14, no. 2 (2004) p. 285-623. 
504 |a Includes bibliographical references. 
650 0 |a Electronic circuits  |x Effect of radiation on. 
650 0 |a Integrated circuits  |x Effect of radiation on. 
700 1 |a Schrimpf, Ronald Donald. 
710 2 |a ebrary, Inc. 
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