Schrimpf, R. D. (2004). Radiation effects and soft errors in integrated circuits and electronic devices. Singapore ; New Jersey: World Scientific Pub..
Chicago Style CitationSchrimpf, Ronald Donald. Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices. Singapore ; New Jersey: World Scientific Pub., 2004.
MLA CitationSchrimpf, Ronald Donald. Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices. Singapore ; New Jersey: World Scientific Pub., 2004.
Warning: These citations may not always be 100% accurate.