Sampling, wavelets, and tomography ; Edit. John J. Benedetto, Ahmed I. Zayed

Other Authors: Benedetto, John J., Zayed, Ahmed I.
Format: Book
Language:English
Published: Boston: Birkhaeuser, c2004
Series:Applied and numerical harmonic analysis
Subjects:
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245 0 0 |a Sampling, wavelets, and tomography ; Edit. John J. Benedetto, Ahmed I. Zayed 
260 |a Boston:  |b Birkhaeuser,  |c c2004 
300 |a xiii, 344 p. ;  |c 24 cm. 
490 0 |a Applied and numerical harmonic analysis 
504 |a Includes bibliographical references and index 
650 0 |a Harmonic analysis 
650 1 0 |a Tomography 
650 0 |a Fourier analysis 
650 0 |a Wavelets (Mathematics) 
700 1 |a Benedetto, John J. 
700 1 |a Zayed, Ahmed I. 
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