Optical characterization of epitaxial semiconductor layers/

Other Authors: Bauer, G, Richter, Wolfgang,
Format: Book
Language:English
Published: Berlin New York: Springer-Verlag, c1996
Subjects:
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008 990123s1996 gr r 000 0 eng d
020 |a 354059129X  |q (hardcover : alk. paper) 
050 |a QC611.6.O6  |b C48 1995 
082 0 |2 20  |a 537.6/22/0287 
245 0 0 |a Optical characterization of epitaxial semiconductor layers/  |c Gunther Bauer, Wolfgang Richter (eds.) 
260 |a Berlin  |b Springer-Verlag,  |c c1996  |a New York: 
300 |a xiv, 429 p. :  |b ill. ;  |c 24 cm 
504 |a Includes bibliographical references (p. [393]-422) and index 
650 0 |a Semiconductors  |x Optical properties 
650 0 |a Heterostructures 
650 0 |a Epitaxy 
650 0 |a Crystal growth 
700 1 |a Bauer, G 
700 1 |a Richter, Wolfgang, 
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