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Optical characterization of ep...
Holdings
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Optical characterization of epitaxial semiconductor layers/
Other Authors:
Bauer, G
,
Richter, Wolfgang,
Format:
Book
Language:
English
Published:
Berlin New York:
Springer-Verlag,
c1996
Subjects:
Semiconductors
>
Optical properties
Heterostructures
Epitaxy
Crystal growth
Holdings
Description
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Βιβλιοθήκη
Ταξιθετικός αριθμός
Αριθμός Αντιτύπων
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Εθνικό και Καποδιστριακό Πανεπιστήμιο Αθηνών
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