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091111s1980 gr erb 001 0 eng d |
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|a 0306406284
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|a GrAtEKP.sci
|b gre
|e AACR2
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|2 22
|a 548.8
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| 245 |
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|a Characterization of crystal growth defects by X-ray methods/
|c edited by Brian K. Tanner and D. Keith Bowen
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| 260 |
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|a New York:
|b Plenum Press,
|c 1980
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| 300 |
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|a xxvi, 589 p. :
|b ill. ;
|c 24 cm.
|
| 490 |
0 |
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|a NATO advanced science institutes series. Series B, Physics ;
|v 63
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| 500 |
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|a Proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom
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| 504 |
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|a Includes bibliographical references and index
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| 650 |
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0 |
|a Crystals
|x Defects
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| 650 |
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0 |
|a X- Ray crystallography
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| 700 |
1 |
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|a Tanner, Brian Keith
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| 700 |
1 |
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|a Bowen, David Keith,
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| 711 |
1 |
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|a Proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods:
|c (Durham, United Kingdom
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| 952 |
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|a GrAtEKP
|b 59cce59f6c5ad134460b8971
|c 998a
|d 945l
|e 548.8 TanB c 1980
|t 1
|x m
|z Books
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