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|a GR-AtNTU
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|2 22
|a 621.38152 PRO
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|a Proscia, James William
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|a Atmospheric pressure chemical vapor deposition of tin oxide films and the surface photovoltage measurements of amorphous silicon /
|c Proscia James William
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| 260 |
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|a Ann Arbor, MI.:
|b UMI Dissertation Services,
|c c1988
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| 300 |
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|a vii, 264 p. :
|b ill. ;
|c 22 cm.
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| 500 |
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|a A thesis presented by James William Proscia to the Department of Chemical Physics.
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| 504 |
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|a Includes bibliographical references.
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| 650 |
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|a Chemical vapor deposition
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| 650 |
1 |
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|a Thin films
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| 650 |
1 |
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|a Amorphous semiconductors
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| 952 |
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|a GRThAnMak
|b 59cc9a246c5ad13446011b1a
|c 998a
|d 945l
|e -
|t 1
|x m
|z Books
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